Scanning electron microscopy (SEM) allows the surface of a sample to be magnified greatly. In this process, a finely focused electron beam scans the surface (“scanning”). The interactions between the electrons and the object are used to generate an image. Energy-dispersive X-ray microanalysis (EDX – Energy-dispersive X-ray spectroscopy) is a form of elemental analysis in which the characteristic X-ray radiation emitted by the elements present is detected.
